- Title
- Characterisation of single event effects and total ionising dose effects of an intel atom microprocessor
- Creator
- Malinda, Muema
- Subject
- Microprocessors
- Subject
- Mechatronics
- Date Issued
- 2019
- Date
- 2019
- Type
- Thesis
- Type
- Masters
- Type
- MEng
- Identifier
- http://hdl.handle.net/10948/41875
- Identifier
- vital:36605
- Description
- The rapid advancements of COTS microprocessors compared to radiation hardened microprocessors has attracted the interest of system designers within the aerospace sector. COTS microprocessors offer higher performance with lower energy requirements, both of which are desired characteristics for microprocessors used in spacecraft. COTS microprocessors, however, are much more susceptible to radiation damage therefore their SEE and TID responses needs to be evaluated before they can be incorporated into spacecraft. This thesis presents the process followed to evaluate said characteristics of a COTS Intel Atom E3815 microprocessor mounted on a DE3815TYBE single board PC. Evaluation of the SEE response was carried out at NRF iThemba Labs in Cape Town, South Africa where the device was irradiated by a proton beam at 55.58 MeV and with varying beam currents. The device showed a higher sensitivity to functional interrupts when running with the onboard cache on compared to when running with the cache off, as would be expected. The cross-sections, respectively, are: 4.5𝑥 10−10 𝑐𝑚2 and 2.8 𝑥 10−10 𝑐𝑚2. TID testing on the other hand was carried out at the irradiation chamber of FruitFly Africa in Stellenbosch, South Africa. The test device was irradiated by gamma radiation from a Cobalt-60 source at a dose rate of 9.7kRad/h and to a total dose of 67.25kRad. Noticeable TID degradation, in the form of leakage currents, was observed once a total dose of about 20kRad was absorbed. The device then completely failed once a total dose of approximately 32kRad was absorbed. These results suggest that the E3815 microprocessor would not be suitable for long term missions that require higher TID survivability. The processor could however be considered for short term missions launched into polar or high incline orbits where the dose rate is relatively low, and the mission is capable of tolerating functional interrupts.
- Format
- xi, 74 leaves
- Format
- Publisher
- Nelson Mandela University
- Publisher
- Faculty of Engineering Built Environment and Information Technology
- Language
- English
- Rights
- Nelson Mandela University
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| Thumbnail | File | Description | Size | Format | |||
|---|---|---|---|---|---|---|---|
| View Details Download | SOURCE1 | MUEMA MALINDA.pdf | 3 MB | Adobe Acrobat PDF | View Details Download |