- Title
- On the characterisation of photovoltaic device parameters using light beam induced current measurements
- Creator
- Bezuidenhout, Lucian John-Ross
- Subject
- Solar cells--Materials
- Subject
- Semiconductors
- Date Issued
- 2015
- Date
- 2015
- Type
- Thesis
- Type
- Masters
- Type
- MSc
- Identifier
- vital:10551
- Identifier
- http://hdl.handle.net/10948/d1020282
- Description
- Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localized characterization of solar cells using a light beam as a probe. The technique allows the determination of local photo response of a cell, the electrical parameters and defects that occur in the individual solar cell. The semiconductor materials used to create solar cells are not always defect free and these defects reduce the electrical performance of the device. It is therefore important to use a system that will allow the characterization and extract the solar cell parameters as can be done using the LBIC system. By analysing these parameters and cell defects, further studies can be done to enhance the cell’s lifetime and hence its efficiency. Light beam induced current (LBIC) is a technique that focuses light onto a solar cell device and thus creating a photo-generated current that can be measured in the external circuit for analyses. By scanning this beam probe across a solar cell while measuring the current-voltage characteristics, a map of various parameters can be obtained. This thesis presents the design of the LBIC system, the software interfacing of the data acquisition system and local photo-response within different solar cell technologies. In addition, this thesis represent two curve fitting algorithms namely: the Gradient Descent Optimisation and the Differential Evolution used for the extraction of solar cell device parameters. The algorithms are based on the one-diode solar cell model and make use of the light generated current-voltage (I-V) data obtained from the LBIC system. Different solar cell technologies namely; single crystalline (c-Si) and multicrystalline silicon (mc-Si) was used for analysis. LBIC maps and I-V characteristics of both technologies was obtained. The LBIC maps shows performance degrading defects present in the bulk and the surface of the solar cells as a function of spatial distribution. These localised defects acts as trapping mechanism for the charge carriers and therefore limits recombination within the solar cell and thus decreasing the performance of the solar cell device. The resulting I-V characteristics obtained from the LBIC system were used to determine the performance parameters using the two algorithms. The resultant effect of these parameters on the performance of the solar cells was observed. The overall results showed that LBIC is a useful tool for identifying and characterising defects in solar cells.
- Format
- xiii, 59 leaves
- Format
- Publisher
- Nelson Mandela Metropolitan University
- Publisher
- Faculty of Science
- Language
- English
- Rights
- Nelson Mandela Metropolitan University
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NMMU School of Computer Science, Mathematics, Physics and Statistics
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