- Title
- Characterisation of photovoltaic devices using large area light beam induced current measurements
- Creator
- Okullo, Michael
- Creator
- Van Dyk, Ernes
- Creator
- Okullo, W
- Subject
- Photovoltaic cells Photovoltaic power generation
- Date Issued
- 2017
- Date
- 2017
- Type
- Thesis
- Type
- Doctoral
- Type
- PhD
- Identifier
- http://hdl.handle.net/10948/20526
- Identifier
- vital:29314
- Description
- Photovoltaic (PV) modules are made by connecting PV cells in series in order to generate a reasonable voltage that can be used for any productive work. Inaccuracy in cell sorting during crystalline silicon module construction, or non-uniform deposition of PV material and laser scribing during thin _lm module construction, may introduce current mismatch in the module. Current mismatch is a consequence of connecting module cells which have non-identical electrical characteristics. When current mismatch occurs in a module, it is the cell generating the lowest current that determines the module output current and this leads to a decrease in the output power and lifespan of the module. Investigation of current uniformity and the different current reducing features in PV modules, which are potential sources of current mismatch, is therefore critical in optimising the performance of PV modules. In this study, a large area light beam induced current (LA-LBIC) measurement system was developed. This non-destructive technique was used to characterise crystalline silicon PV modules (mono-crystalline and multi-crystalline), thin _lm PV modules (amorphous silicon and copper indium diselenide) and a combined concentrator photovoltaic (CPV) module. A light source mounted onto a motorised x-y scanning stage was used to illuminate a PV module, or the Fresnel lens of a CPV module, point-by-point, while measuring the module output current. The measured current was mapped as a function of position and presented as an LBIC image. The point-illuminated circuit model of a PV module was designed and used to explain the variation in current between and within module cells in the LA-LBIC maps. Application of the model to crystalline silicon modules attributes the variation in photo-generated current between cells mainly to current mismatch between series connected cells. Current variation within cells is attributed to individual cell shunts. In the thin _lm modules, the model attributes the variation in photo-generated current mainly to differences in local cell shunts and series resistances originating from the scribing procedure during cell formation in the manufacturing process. In the PV modules studied, variation in photo-generated current was found to exist both between and within cells. The variation was more pronounced between cells than within cells. Module point I-V curves at different points of the module were measured in order to extract short circuit current, to quantify the variations between and within cells. A striation ring defect, causing a drop in short circuit current of 38%, was detected in the mono-crystalline module. Investigation of the striation ring defect indicated that the defect is active in the bulk (p-type) but inactive in the top (n-type) layer. Further characterisation of the defect revealed that a higher percentage loss in short circuit current occurs at lower light intensities. In the multi-crystalline silicon module, cracks were detected and found to electrically isolate the module cells into two parts, causing them to operate in parallel and consequently introducing current mismatch in the module. The I-V curve of the module at standard test condition (STC) revealed a step below the knee, which is a manifestation of current mismatch in the module. High currents, as a consequence of diffuse reflection, leading to multiple reflections by the top glass were also observed at localised points on the bus bar and cell separations. In the a-Si module, the variation in photo-current within some cells, was found to be substantial. In the copper indium diselenide (CIS) module, an electrical disconnection across the module cells was identified. A disconnection in the form of a triangular shape was also identified in this module, which completely disconnected the front contact of this area from the module. This unique disconnection feature caused current in the module to follow in a reverse direction when the light spot was incident within the boundary of the disconnection. Scans performed under different forward voltage biases were useful in identifying severely shunted module cells. A severely shunted cell was found to generate a higher photo-current than a good cell at the same forward bias voltage. This unique observation was explored further using point-illuminated module I-V measurements, and was found to be due to the crossing over of the I-V curves of the two cells. In order to explore the relationship between cell photo-current and cell shunt resistance, a method to determine the shunt resistances of the cells in an encapsulated module was devised. The method involves measuring the I-V curves of a fully illuminated module and a partially illuminated module when one of its cells is shaded and the I-V curves used to determine the short circuit current and the shunt resistance of the shaded cell. A strong correlation was found to exist between the short circuit current of the shaded cell and the cell shunt resistance, as well as between the short circuit current of the shaded cell and dark LBIC. The LA-LBIC technique was further applied to characterise a combine CPV module. Results showed that the Fresnel lens facets close to the centre generate a higher photo-current at the receiver than those towards the edges. The reduced photo-current towards the edges was attributed to losses due to di_raction, dielectric reflection and internal re_ection. About 65% of the area of the Fresnel lenses were found to be e_ective in light collection in terms of the photo-current generated at the receiver. Abrasions and scratches on the Fresnel lenses were identi_ed as some of the current limiting features in a CPV module. The LA-LBIC technique used in this study has demonstrated the potential to investigate current mismatch, current limiting and current enhancing features in PV modules. The capacity to further characterise current limiting features in order to investigate their effects on photo-current under different wavelengths and light intensities was also demonstrated. Extending the LA-LBIC technique to characterise a combined CPV module is a great achievement of this work.
- Format
- xxii, 161 leaves
- Format
- Publisher
- Nelson Mandela Metropolitan University
- Publisher
- Faculty of Science
- Language
- English
- Rights
- Nelson Mandela Metropolitan University
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NMU School of Computer Science, Mathematics, Physics and Statistics
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