- Title
- Defect-related photoluminescence of zinc oxide nanorods
- Creator
- Mbulanga, Crispin Munyelele
- Subject
- Photoluminescence Zinc oxide
- Date Issued
- 2015
- Date
- 2015
- Type
- Thesis
- Type
- Masters
- Type
- MSc
- Identifier
- http://hdl.handle.net/10948/10318
- Identifier
- vital:26652
- Description
- In this dissertation, Zinc oxide (ZnO) nanorods grown by a two-step chemical bath deposition method on Si substrate is characterized. Research was conducted on ZnO nanorods for the understanding of their optical properties at room temperature (RT), with the emphasis on the visible luminescence. To this end, controlled thermal treatments of as-grown ZnO nanorods were conducted under different conditions, such as annealing time and environment, at atmospheric pressure. Results related to the following studies are reported: an investigation of the structure of ZnO nanorods, an analysis of the chemical composition of the surface, an investigation of the surface stoichiometry of the rods, and a study of defect-related photoluminescence of ZnO nanorods upon thermal treatment in different ambients.To achieve this, the samples were investigated by Scanning Electron Microscopy (SEM), X-ray Diffraction (XRD), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES) and room temperature (RT) photoluminescence Spectroscopy (PL). As-grown ZnO nanorods exhibit a hexagonal shape and have the wurtzite structure; they have, respectively, an average length and diameter of ~900 nm and ~50 nm, and most of the rods are perpendicular to the substrate. The main extrinsic species found in as-grown nanostructures are C, H, F, S, and Cl. ToF-SIMS and XPS confirmed the presence of H related-defects, and the oxygen 1 S XPS peak at 531.5 eV is therefore assigned to oxygen bound to H-related defects. Based on stoichiometry studies, it is found that the near surface regions of as-grown ZnO nanorods (2 to 10 monolayers) are rich in Zn. The RT luminescence of as-grown ZnO nanorods exhibits a near band edge emission centered at ~379.5 nm and deep level emission extending from ~450 nm to ~850 nm. When these nanorods are thermally treated at high temperatures (>850 oC), it is found that even though their crystalline quality is preserved, their morphology is significantly affected, regardless of annealing ambient. Furthermore, in the near surface regions of annealed ZnO nanorods it is found that the Zn/O stoichiometric ratios deviate from unity. Specifically, oxygen vacancies form within the first 100 nm from the sample surface. Further from the surface, the material is deficient in Zn. It is deduced from XPS and AES that the ambient affects the activation rate of intrinsic defects. Furthermore, the only extrinsic defects that are affected by thermal treatment are found to be H-related defects. At high annealing temperatures (300 oC to ~700 oC), H-related defects are removed, and this removal process is found to affect significantly the RT luminescence properties of ZnO nanorods. Specifically, hydrogen passivates vacancy-related defects, depending on the thermal treatment. PL spectroscopy is used to follow this passivation effect as a function of annealing temperature, which causes an initial quenching followed by an enhancement of the green and the red luminescence, regardless of the ambient. Finally, the green luminescence that arises following annealing above ~800 oC is assigned to Zn vacancy-related defects, while the red luminescence that dominates the visible band of ZnO nanorods upon annealing between 400 oC and 600 oC is suggested to be due to oxygen vacancy-related defects.
- Format
- ix, 84 leaves
- Format
- Publisher
- Nelson Mandela Metropolitan University
- Publisher
- Faculty of Science
- Language
- English
- Rights
- Nelson Mandela Metropolitan University
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