Single event upset testing of flash based field programmable gate arrays
- Authors: Potgieter, Juan-Pierre
- Date: 2015
- Subjects: Field programmable gate arrays
- Language: English
- Type: Thesis , Masters , MEngineering
- Identifier: http://hdl.handle.net/10948/12520 , vital:27083
- Description: In the last 50 years microelectronics have advanced at an exponential rate, causing microelectronic devices to shrink, have very low operating voltages and increased complexities; all this has made circuits more sensitive to various kinds of failures. These trends allowed soft errors, which up until recently was just a concern for space application, to become a major source of system failures of electronic products. The aim of this research paper was to investigate different mitigation techniques that prevent these soft errors in a Video Graphics Array (VGA) controller which is commonly used in projecting images captured by cameras. This controller was implemented on a Flash Based Field Programmable Gate array (FPGA). A test set-up was designed and implemented at NRF iThemba LABS, which was used to conduct the experiments necessary to evaluate the effectiveness of different mitigation techniques. The set-up was capable of handling multiple Device Under Tests (DUT) and had the ability to change the angle of incidence of each DUT. The DUTs were radiated with a 66MeV proton beam while the monitoring equipment observed any errors that had occurred. The results obtained indicated that all the implemented mitigation techniques tested on the VGA system improved the system’s capability of mitigating Single Event Upsets (SEU). The most effective mitigation technique was the OR-AND Multiplexer Single Event Transient (SET) filter technique. It was thus shown that mitigation techniques are viable options to prevent SEU in a VGA controller. The permanent SEU testing set-up which was designed and manufactured and was used to conduct the experiments, proved to be a practical option for further microelectronics testing at iThemba LABS.
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- Date Issued: 2015
Hardware evolution of a digital circuit using a custom VLSI architecture
- Authors: Van den Berg, Allan Edward
- Date: 2013
- Subjects: Digital electronics , Field programmable gate arrays , Sequential machine theory
- Language: English
- Type: Thesis , Masters , MEngineering (Mechatronics)
- Identifier: vital:9661 , http://hdl.handle.net/10948/d1020984
- Description: This research investigates three solutions to overcoming portability and scalability concerns in the Evolutionary Hardware (EHW) field. Firstly, the study explores if the V-FPGA—a new, portable Virtual-Reconfigurable-Circuit architecture—is a practical and viable evolution platform. Secondly, the research looks into two possible ways of making EHW systems more scalable: by optimising the system’s genetic algorithm; and by decomposing the solution circuit into smaller, evolvable sub-circuits or modules. GA optimisation is done is by: omitting a canonical GA’s crossover operator (i.e. by using an algorithm); applying evolution constraints; and optimising the fitness function. The circuit decomposition is done in order to demonstrate modular evolution. Three two-bit multiplier circuits and two sub-circuits of a simple, but real-world control circuit are evolved. The results show that the evolved multiplier circuits, when compared to a conventional multiplier, are either equal or more efficient. All the evolved circuits improve two of the four critical paths, and all are unique. Thus, it is experimentally shown that the V-FPGA is a viable hardware-platform on which hardware evolution can be implemented; and how hardware evolution is able to synthesise novel, optimised versions of conventional circuits. By comparing the and canonical GAs, the results verify that optimised GAs can find solutions quicker, and with fewer attempts. Part of the optimisation also includes a comprehensive critical-path analysis, where the findings show that the identification of dependent critical paths is vital in enhancing a GA’s efficiency. Finally, by demonstrating the modular evolution of a finite-state machine’s control circuit, it is found that although the control circuit as a whole makes use of more than double the available hardware resources on the V-FPGA and is therefore not evolvable, the evolution of each state’s sub-circuit is possible. Thus, modular evolution is shown to be a successful tool when dealing with scalability.
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- Date Issued: 2013