Dynamics of stimulated luminescence in natural quartz: Thermoluminescence and phototransferred thermoluminescence
- Authors: Folley, Damilola Esther
- Date: 2020
- Subjects: Thermoluminescence , Quartz
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/146255 , vital:38509
- Description: Natural quartz has remained an important mineral that is of topical interest in luminescence and dosimetry-related research. We investigate the dynamics of stimulated luminescence on this material through thermoluminescence (TL) and phototransferred thermoluminescence (PTTL). Measurements were made on unannealed natural quartz as well as quartz annealed at 800 and 1000̊C. The samples were annealed for 10 minutes and for 1 hour. The material, in its un- and annealed state has its main peak between 68 and 72̊C when measured at 1Cs ̃1 after a dose of 50 Gy. A study of dosimetric features and kinetic analysis was carried out on two prominent peaks, peak I and III for all the samples. The peaks show a sublinear dose response for irradiation doses between 10 and 300 Gy. Kinetic analysis shows that peak I is a first-order peak and peak III a general-order peak. Interestingly, we observe for peak I for the sample annealed at 800̊C for 1 hour an inverse thermal quenching behaviour. We demonstrate that a peak affected with an inverse thermal quenching-like behaviour can still show effect of thermal quenching when the dose the sample is irradiated to is significantly reduced. We ascribe the apparent dependence of thermal quenching on dose to competition between radiative and non-radiative transitions at the recombination centre. Peaks I, II, and III for all the samples were reproduced under phototransfer when the peaks, initially removed by preheating to a certain temperature are exposed to 470 and 525 nm light. The infuence of duration of illumination on the PTTL intensity of these peaks corresponding to various preheating temperatures is modelled using coupled first-order dfferential equations. The model is based on systems of acceptors and donors whose number and role depends on preheating temperature
- Full Text:
- Date Issued: 2020
- Authors: Folley, Damilola Esther
- Date: 2020
- Subjects: Thermoluminescence , Quartz
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/146255 , vital:38509
- Description: Natural quartz has remained an important mineral that is of topical interest in luminescence and dosimetry-related research. We investigate the dynamics of stimulated luminescence on this material through thermoluminescence (TL) and phototransferred thermoluminescence (PTTL). Measurements were made on unannealed natural quartz as well as quartz annealed at 800 and 1000̊C. The samples were annealed for 10 minutes and for 1 hour. The material, in its un- and annealed state has its main peak between 68 and 72̊C when measured at 1Cs ̃1 after a dose of 50 Gy. A study of dosimetric features and kinetic analysis was carried out on two prominent peaks, peak I and III for all the samples. The peaks show a sublinear dose response for irradiation doses between 10 and 300 Gy. Kinetic analysis shows that peak I is a first-order peak and peak III a general-order peak. Interestingly, we observe for peak I for the sample annealed at 800̊C for 1 hour an inverse thermal quenching behaviour. We demonstrate that a peak affected with an inverse thermal quenching-like behaviour can still show effect of thermal quenching when the dose the sample is irradiated to is significantly reduced. We ascribe the apparent dependence of thermal quenching on dose to competition between radiative and non-radiative transitions at the recombination centre. Peaks I, II, and III for all the samples were reproduced under phototransfer when the peaks, initially removed by preheating to a certain temperature are exposed to 470 and 525 nm light. The infuence of duration of illumination on the PTTL intensity of these peaks corresponding to various preheating temperatures is modelled using coupled first-order dfferential equations. The model is based on systems of acceptors and donors whose number and role depends on preheating temperature
- Full Text:
- Date Issued: 2020
Thermoluminescence and phototransferred phermoluminescence of synthetic quartz
- Authors: Dawam, Robert Rangmou
- Date: 2020
- Subjects: Thermoluminescence , Quartz
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/145849 , vital:38472
- Description: The main aim of this investigation is on thermoluminescence and phototransferred thermoluminescence of synthetic quartz. Thermoluminescence was one of the tools used in characterising the electron traps parameters. The samples of quartz annealed at various temperatures up to 900̊C and the unannealed were used. The thermoluminescence glow curve was measured at 1̊C s~ 1 following beta irradiation to 40 Gy from the samples annealed at 500̊C and the unannealed consist of main peak at 70̊C and secondary peaks at 110, 180 and 310̊C. In comparison, the thermoluminescence glow curve for the sample annealed at 900̊C have main peak at 86̊C and the secondary ones at 170 and 310̊C. The kinetic analysis was carried out only on the main peak in each case. The activation energy was found to be decreasing with increase in annealing temperatures. The samples annealed at 500̊C and the unannealed were found to be affected by thermal quenching while sample annealed at 900̊C shows an inverse quenching for irradiation dose of 40 Gy. However, when the dose was reduce to 3 Gy the effects of thermal quenching was manifested. The activation energy of thermal quenching was also found to decrease with increase in annealing temperature. Thermally assisted optically stimulated luminescence measurement was carried out using continuous wave optical stimulated luminescence (CW-OSL). The samples studied were those annealed at 500̊C for 10 minutes, 900̊C for 10, 30, 60 minutes and 1000̊C for 10 minutes prior to use. The CW-OSL is stimulated using 470 nm blue LEDs at sample temperatures between 30 and 200̊C. It is measured after preheating to either 300 and 500̊C. When the integrated OSL intensity is plotted as a function of measurement temperature, the intensity goes through a peak. The increase in OSL intensity as a function of temperature is associated to thermal assistance and the decrease to thermal quenching. The kinetic parameters were evaluated by fitting the experimental data. The values of activation energies of thermal quenching are the same within experimental uncertainties for all the experimental conditions. This shows that annealing temperature, duration of annealing and irradiation dose have a negligible influence on the recombination site of luminescence using OSL. Phototransferred thermoluminescence (PTTL) induced from annealed samples using 470 nm blue light was also investigated. The quartz were annealed at 500 _C for 10 minutes, 900̊C for 10, 30, 60 minutes and 1000̊C for 10 minutes prior to use. The glow curves of conventional TL measured at 1 _C s1 following irradiation to 200 Gy shows six peaks in each case labelled I-VI for ease of reference whereas peaks observed under PTTL are referred to as A1 onwards. Only the first three peaks were reproduced under phototransfer for the sample annealed at 900̊C for 60 minutes and 1000̊C C for 10 minutes. Interestingly, for the intermediate duration of annealing of 30 minutes, the only peak that appears under phototransfer is the A1. For quartz annealed at 900̊C for 10 minutes, the PTTL appears as long as the preheating temperature does not exceed 560̊C. All other annealing temperatures, PTTL only appears for preheating to 450 and below. This shows that the occupancy of deep electron traps at temperatures beyond 450̊C or 560̊C is low. The activation energy for peaks A1, A2 and A3 were calculated. The PTTL peaks were studied for thermal quenching and peaks A1 and A3 were found to be affected. The activation energies for thermal quenching were determined as 0.62 ± 0.04 eV and 0.65 ± 0.02 eV for peaks A1 and A3 respectively. The experimental dependence of PTTL intensity on illumination time is modelled using sets of coupled linear differential equations based on systems of donors and acceptors whose number is determined by preheating temperature.
- Full Text:
- Date Issued: 2020
- Authors: Dawam, Robert Rangmou
- Date: 2020
- Subjects: Thermoluminescence , Quartz
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/145849 , vital:38472
- Description: The main aim of this investigation is on thermoluminescence and phototransferred thermoluminescence of synthetic quartz. Thermoluminescence was one of the tools used in characterising the electron traps parameters. The samples of quartz annealed at various temperatures up to 900̊C and the unannealed were used. The thermoluminescence glow curve was measured at 1̊C s~ 1 following beta irradiation to 40 Gy from the samples annealed at 500̊C and the unannealed consist of main peak at 70̊C and secondary peaks at 110, 180 and 310̊C. In comparison, the thermoluminescence glow curve for the sample annealed at 900̊C have main peak at 86̊C and the secondary ones at 170 and 310̊C. The kinetic analysis was carried out only on the main peak in each case. The activation energy was found to be decreasing with increase in annealing temperatures. The samples annealed at 500̊C and the unannealed were found to be affected by thermal quenching while sample annealed at 900̊C shows an inverse quenching for irradiation dose of 40 Gy. However, when the dose was reduce to 3 Gy the effects of thermal quenching was manifested. The activation energy of thermal quenching was also found to decrease with increase in annealing temperature. Thermally assisted optically stimulated luminescence measurement was carried out using continuous wave optical stimulated luminescence (CW-OSL). The samples studied were those annealed at 500̊C for 10 minutes, 900̊C for 10, 30, 60 minutes and 1000̊C for 10 minutes prior to use. The CW-OSL is stimulated using 470 nm blue LEDs at sample temperatures between 30 and 200̊C. It is measured after preheating to either 300 and 500̊C. When the integrated OSL intensity is plotted as a function of measurement temperature, the intensity goes through a peak. The increase in OSL intensity as a function of temperature is associated to thermal assistance and the decrease to thermal quenching. The kinetic parameters were evaluated by fitting the experimental data. The values of activation energies of thermal quenching are the same within experimental uncertainties for all the experimental conditions. This shows that annealing temperature, duration of annealing and irradiation dose have a negligible influence on the recombination site of luminescence using OSL. Phototransferred thermoluminescence (PTTL) induced from annealed samples using 470 nm blue light was also investigated. The quartz were annealed at 500 _C for 10 minutes, 900̊C for 10, 30, 60 minutes and 1000̊C for 10 minutes prior to use. The glow curves of conventional TL measured at 1 _C s1 following irradiation to 200 Gy shows six peaks in each case labelled I-VI for ease of reference whereas peaks observed under PTTL are referred to as A1 onwards. Only the first three peaks were reproduced under phototransfer for the sample annealed at 900̊C for 60 minutes and 1000̊C C for 10 minutes. Interestingly, for the intermediate duration of annealing of 30 minutes, the only peak that appears under phototransfer is the A1. For quartz annealed at 900̊C for 10 minutes, the PTTL appears as long as the preheating temperature does not exceed 560̊C. All other annealing temperatures, PTTL only appears for preheating to 450 and below. This shows that the occupancy of deep electron traps at temperatures beyond 450̊C or 560̊C is low. The activation energy for peaks A1, A2 and A3 were calculated. The PTTL peaks were studied for thermal quenching and peaks A1 and A3 were found to be affected. The activation energies for thermal quenching were determined as 0.62 ± 0.04 eV and 0.65 ± 0.02 eV for peaks A1 and A3 respectively. The experimental dependence of PTTL intensity on illumination time is modelled using sets of coupled linear differential equations based on systems of donors and acceptors whose number is determined by preheating temperature.
- Full Text:
- Date Issued: 2020
Combined spectral and stimulated luminescence study of charge trapping and recombination processes in α-Al2O3:C
- Authors: Nyirenda, Angel Newton
- Date: 2018
- Subjects: Luminescence , Thermoluminescence , Luminescence spectroscopy , Carbon-doped aluminium oxide , Radioluminescence , Time-resolved X-ray excited optical luminescence
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/62683 , vital:28235
- Description: The main objective of this project was to gain a deeper and better understanding of the luminescence processes in a-Al₂O₃:C, a highly-sensitive dosimetric material, using a combined spectral and stimulated luminescence study. The spectral studies concentrated on the emission spectra obtained using X-ray induced radioluminescence (XERL), thermoluminescence (XETL) and time-resolved X-ray excited optical luminescence (TR-XEOL) techniques. The stimulated luminescence studies were based on thermoluminescence (TL), optically stimulated luminescence (OSL) and phototransferred TL (PTTL) methods that were used in the study of the radiation-induced defects at high beta-doses and the deep traps, that is, traps with thermal depths beyond 500°C. The spectral and stimulated luminescence measurements were carried out using a high sensitivity luminescence spectrometer and a Ris0 TL/OSL Model DA-20 Reader, respectively. The XERL emission spectrum measured at room temperature shows seven gaussian peaks associated with F-centres (420 nm), F+-centres (334 nm), F2+-centres (559 nm), Stoke’s vibronic band of Cr3+ (671 nm), Cr3+ R-line emission (694 nm), anti-Stokes vibronic band of Cr3+ (710 nm) and an unidentified emission band (260-300 nm) which we associate with hole recombinations at a luminescence centre. The 694-nm R-line emission from Cr3+ impurity ions is most likely due to recombination of holes at Cr2+ during stimulated luminescence and as a result of an intracentre excitation of Cr3+ in photoluminescence (PL) due to photon absorption. The Cr3+ emission decreases in intensity, whereas the intensity of F-centre emission band is almost constant with repeated XERL measurements. Depending on the amount of X-ray irradiation dose, both holes and/or electrons may take place in the emission processes of peaks I (30-80°C), II (90-250°C) and III (250-320°C) during a TL readout, albeit, electron recombination is dominant regardless of dose. At higher doses, the XETL emission spectra indicate that the dominant band associated with TL peak III (250-320°C) in the material, shifts from F-centre to Cr3+. Using the deep-traps OSL, it has been confirmed that the main TL trap is also the main OSL trap whereas the TL traps lying in the temperature range of 400-550°C constitute the secondary OSL traps. There is evidence of strong retrapping at the main trap during optical stimulation of charges from the secondary OSL traps and the deep traps and that the retrapping occurs via the delocalized bands. At high-irradiation beta-doses, aggregate defect centres which significantly alter the TL and OSL properties, are induced in the material. The induced aggregate centres get completely obliterated by heating a sample to 700°C. The radiation-induced defects cause the main TL peak to shift towards higher temperatures, increase its FWHM, reduce its maximum intensity and cause an underestimation of both the activation energy and order of kinetics of the peak. On the other hand, the OSL response of the material is enhanced following a high-irradiation dose. During sample storage in the dark at ambient temperature, charges do migrate from the deep traps (donors) to the main and intermediate traps (acceptors) and that the major donor traps during this charge transfer phenomenon lie between 500-600°C.
- Full Text:
- Date Issued: 2018
- Authors: Nyirenda, Angel Newton
- Date: 2018
- Subjects: Luminescence , Thermoluminescence , Luminescence spectroscopy , Carbon-doped aluminium oxide , Radioluminescence , Time-resolved X-ray excited optical luminescence
- Language: English
- Type: text , Thesis , Doctoral , PhD
- Identifier: http://hdl.handle.net/10962/62683 , vital:28235
- Description: The main objective of this project was to gain a deeper and better understanding of the luminescence processes in a-Al₂O₃:C, a highly-sensitive dosimetric material, using a combined spectral and stimulated luminescence study. The spectral studies concentrated on the emission spectra obtained using X-ray induced radioluminescence (XERL), thermoluminescence (XETL) and time-resolved X-ray excited optical luminescence (TR-XEOL) techniques. The stimulated luminescence studies were based on thermoluminescence (TL), optically stimulated luminescence (OSL) and phototransferred TL (PTTL) methods that were used in the study of the radiation-induced defects at high beta-doses and the deep traps, that is, traps with thermal depths beyond 500°C. The spectral and stimulated luminescence measurements were carried out using a high sensitivity luminescence spectrometer and a Ris0 TL/OSL Model DA-20 Reader, respectively. The XERL emission spectrum measured at room temperature shows seven gaussian peaks associated with F-centres (420 nm), F+-centres (334 nm), F2+-centres (559 nm), Stoke’s vibronic band of Cr3+ (671 nm), Cr3+ R-line emission (694 nm), anti-Stokes vibronic band of Cr3+ (710 nm) and an unidentified emission band (260-300 nm) which we associate with hole recombinations at a luminescence centre. The 694-nm R-line emission from Cr3+ impurity ions is most likely due to recombination of holes at Cr2+ during stimulated luminescence and as a result of an intracentre excitation of Cr3+ in photoluminescence (PL) due to photon absorption. The Cr3+ emission decreases in intensity, whereas the intensity of F-centre emission band is almost constant with repeated XERL measurements. Depending on the amount of X-ray irradiation dose, both holes and/or electrons may take place in the emission processes of peaks I (30-80°C), II (90-250°C) and III (250-320°C) during a TL readout, albeit, electron recombination is dominant regardless of dose. At higher doses, the XETL emission spectra indicate that the dominant band associated with TL peak III (250-320°C) in the material, shifts from F-centre to Cr3+. Using the deep-traps OSL, it has been confirmed that the main TL trap is also the main OSL trap whereas the TL traps lying in the temperature range of 400-550°C constitute the secondary OSL traps. There is evidence of strong retrapping at the main trap during optical stimulation of charges from the secondary OSL traps and the deep traps and that the retrapping occurs via the delocalized bands. At high-irradiation beta-doses, aggregate defect centres which significantly alter the TL and OSL properties, are induced in the material. The induced aggregate centres get completely obliterated by heating a sample to 700°C. The radiation-induced defects cause the main TL peak to shift towards higher temperatures, increase its FWHM, reduce its maximum intensity and cause an underestimation of both the activation energy and order of kinetics of the peak. On the other hand, the OSL response of the material is enhanced following a high-irradiation dose. During sample storage in the dark at ambient temperature, charges do migrate from the deep traps (donors) to the main and intermediate traps (acceptors) and that the major donor traps during this charge transfer phenomenon lie between 500-600°C.
- Full Text:
- Date Issued: 2018
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