- Title
- Microstructural characterization of Swift Heavy Ion (SHI) induced rotation in single crystal NiO
- Creator
- Douglas-Henry, Danielle
- Subject
- Port Elizabeth (South Africa)
- Subject
- Eastern Cape (South Africa)
- Subject
- South Africa
- Date Issued
- 2021-12
- Date
- 2021-12
- Type
- Doctoral theses
- Type
- text
- Identifier
- http://hdl.handle.net/10948/53648
- Identifier
- vital:45685
- Description
- Swift Heavy Ions (SHI) are characterised by having energies greater than 1 MeV per nucleon with an atomic mass greater than 6 amu. Exposure to irradiation of this type has been known to produce latent tracks in insulators. This is due to the energy loss through the material being governed by electronic excitation processes. The extent of the track formation and microstructural changes induced has been reported to be material specific. Models such as the thermal spike model have been used to explain these changes, however rough approximations are still made. A particularly under studied phenomena is the collective rotation seen in materials exposed to off-normal incidence irradiation. To date the only available experimental data is X-Ray Diffraction (XRD) spectra and surface shifts. This does not allow for depth-dependent rotation studies and very little can be deduced regarding the microstructure of the modified volume. In this study, the microstructural changes in single crystal Nickel Oxide (NiO) have been studied using electron microscopy techniques. A depth dependent investigation of the crystal rotation was performed using Selected Area Electron Diffraction (SAED), Transmission Kikuchi Diffraction (TKD) and Electron Backscatter Diffraction (EBSD). Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) were utilized to interrogate the microstructural changes facilitating the bulk rotation. Five different NiO specimens were investigated. Specimens had surfaces parallel to either the {0 0 1} or {1 1 1} planes. Ion energies used were 593 MeV, 940 MeV and 1.6 GeV, while fluences ranged from 1.0 x 1011 ions/cm² to 9.6 x 1014 ions/cm². Latent track formation in both low fluence (nonoverlapping regime) and high fluence (overlapping regime) specimens were investigated and compared.
- Description
- Thesis (PhD) -- Faculty of Science, School of Computer Science, Mathematics, Physics and Statistics, 2021
- Format
- computer
- Format
- online resource
- Format
- application/pdf
- Format
- 1 online resource (xxvii, 163 leaves)
- Format
- Publisher
- Nelson Mandela University
- Publisher
- Faculty of Science
- Language
- English
- Rights
- Nelson Mandela University
- Rights
- All Rights Reserved
- Rights
- Open Access
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